Scanning Electron Microscopy instruments – SEM
HITACHI-TM3000
An easy-access tabletop electron microscope.
Capabilities
- Thermionic-type filament
- Acc. Voltage: 5 kV or 15 kV
- Magnification: 15x–30 000x
- Option: Bruker Quantax 70 EDS. Resolution: 135eV, Detectable from boron.
JEOL JSM IT-800
The SEM and associated sample preparation equipment, see below, are Swedish Research Council infrastructure and thus with highly subsidised instrument fee.
Capabilities
- Schottky-type FEG
- Acceleration voltage: 0.01–30 kV
- Maximum current: 500 nA (30 kV)
- Resolution from 0.6 nm.
- Detectors options:
- Retractable segmented BSED,
- Low vacuum BSED
- In lens hybrid detector (BE and SE at BD)
- Retractable segmented Quad STEM detector
- (DF, HAADF, ANNULAR and BF)
- X-ray Spectrometer:
- EDS detector (JEOL, SDD, 100 mm2)
- Soft X-ray emission spectrometer (SXES), with
- gratings JS50XL and JS200N (50–210 eV, res. 0.3 eV)
- Cryogenic: Removable Cryogenic Stage (-120 C) and Cryogenic/Vacuum transfer system.
JEOL JSM 7000F
- Schottky-type FEG
- Acc. Voltage: 0.1 ~ 30 kV
- Maximum current: 200nA
- Resolution = 1.0 nm (15 kV)
Last updated: 2026-04-15
Source: Department of Chemistry