Transmission electron Microscopy instruments – TEM

Themis Z

Themis Z is a 300 kV equipped with probe and image aberration correctors, providing excellent imaging capability at atomic resolution in both high-resolution STEM (scanning transmission electron microscopy) and TEM. The microscope is financed by support from the Faculty of Science and Department of Chemistry, Stockholm University.

Faculty of Science at Stockholm University

Themis Z (TEM/STEM) specifications

Schottky-type field emission gun XFEG with Monochromator
Voltage: 300 kV (60 kV, 200 kV)
Energy resolution > 0.2 eV
Probe and Image Cs correctors
Resolution: 300 kV: ≤ 60 pm, 200kV: ≤ 70 pm, 60 kV: ≤100 pm
CL apertures C2: 150, 70, 50 and 10 µm
SA apertures: 800, 200, 40 and 10 µm
Gatan Oneview camera with In-situ option (4kx4k, ≥300 fps at 512´512)
SuperX EDS detector (Resolution ≤136 eV, Detectable Z ≥ B)
Gatan Quantum 965 ER (Energy spread: 0.25 eV at 300 kV, CCD for image filter: 2k´2k)
STEM Detectors: BF, ADF (DPC & iDPC), ABF and HAADF; Gatan BF and ADF

Themis (TEM/STEM) Sample holders

Single tilt (±35°)
Low-background double-tilt (±35°/±30°)
Vacuum transfer double-tilt (±30°/±30°)
High-tilt tomography (±70°)
Motorized dual-axis tomography (±70°)
Double-tilt cooling (-170 °C; ±30°/±30o)
Double-tilt heating (1000 °C; ±30°/±30°)
Cryo-transfer (-170 °C; ±70°)

JEOL JEM 2100F/LAB6

In addition to the Themis Z instrument EMC possesses two 200 kV instruments upgraded with modern imaging detectors allowing advanced imaging and diffraction techniques.

JEOL JEM-2100 (TEM/STEM) Specification

LaB6 filament
High-tilt Polepieces (HTP): (f=2.7mm, Cs=1.4mm, Cc=1.8mm)
Voltages: 80, 100, 120, 200 kV
Resolution: Point=2.5Å, Lattice=1.4Å
CL apertures: 10, 50, 70, 150µm
SA apertures: 10, 20, 50, 100µm
Magnification: 50x-1,200,000x

JEOL JEM-2100 (TEM/STEM) Options

Upper mount CCD (Gatan Orius SC200D)
Bottom mount CCD (Gatan Orius SC1000)
EDS (Resolution = 138 eV, Detectable Z ≥ B)
JEOL STEM ADF detector
Precession diffraction device (JEOL & NanoMEGAS)
Beam blanking device (JEOL)
JEOL BEI detector

JEOL JEM-2100 (TEM/STEM) Sample holders

Single-tilt (±42o; high-tilt option: ±60o)
Double-tilt low-background (±42o /±30o)
Single-tilt vacuum transfer (±30o)
Ultrahigh-tilt for tomography (±80o)
Dual-axis tomography holder (±70o)
Single-tilt cryo-transfer (Gatan CT3500; ±42o)
Single-tilt cryo-transfer (Gatan 914; ±65o)
Double-tilt liquid nitrogen cooling (Gatan CHDT3504; -170 oC; ±42o/ ±30o)
Double-tilt heating (Gatan 652DT; 1000 oC; ±42o/ ±30o)

JEOL JEM 2100F (TEM/STEM) specifications

Schottky-type field emission gun
Ultra-high Resolution Polepieces (URP)
Voltage: 200 kV (or 80 kV)
Resolution: Point=1.9 Å, Lattice=1.0 Å, Information limit=1.3Å
CL apertures: 1, 10, 40, 100, 200 µm
SA apertures: 1, 2, 10, 20, 50, 100 µm
Magnification: 50x-1,500,000x

JEOL JEM 2100F (TEM/STEM) Options

Bottom-mounted camera (Gatan Ultrascan 1000)
Side-mounted camera (Gatan Orious 200D)
EDS (Resolution=138 eV, Detectable Z ≥ B)
Gatan GIF Tridiem (Resolution=0.7eV, CCD for image filter: 2k´2k)
Gatan STEM BF / ADF
JEOL STEM BF/ADF
JEOL BEI detector

Contact information

Staff scientist: Cheuk-Wai Tai
Staff scientist: Anumol Erumpukuthickal Ashokkumar

Last updated: 2026-03-10

Source: Department of Chemistry