Element- and surface structure analysis with Scanning electron microscope

A Scanning Electron Microscope (SEM) allows for the high-magnification and deep-focus analysis of surface structures on an object while simultaneously conducting elemental analysis to determine the object's chemical composition.

SEM has diverse applications in archaeology and is favoured for its non-invasive nature when examining artefacts. SEM is capable of analysing various types of archaeological findings, including metal objects, ceramics, minerals, textiles, glass, bones, stones, hair, bread, wood, pollen, and eggshells.

For certain sample matrices such as liquids or soil, we recommend using our other analytical instruments like X-ray Fluorescence (XRF) or Inductively Coupled Plasma Mass Spectrometry (ICP-MS). SEM is suitable for objects with dimensions of up to 10 cm, and the objects intended for analysis should be free from any coatings or varnishes.

SEM analysis of metal objects from an Iron Age context. Photo: Hans Ahlgren.
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