Our instruments TEM
There are several TEM instrumens at the department, with our flagship Themis Z.
The flagship is the aberration-corrected transmission electron microscope Thermo Fisher Scientific™ Themis Z. It is equipped with probe and image aberration correctors, providing excellent imaging capability at atomic resolution in both high-resolution STEM (scanning transmission electron microscopy) and TEM.
Themis Z
The microscope currently can be operated at accelerating voltages of 60 kV, 200 kV and 300 kV. Themis Z at EMC delivers spatial resolution ≤ 60 pm in both TEM and STEM at 300 kV. A Gatan Oneview camera with in-situ option is present for fast acquisition of high quality TEM images (max 300 frames per second). A range of STEM detectors are present for collecting signals simultaneously to form different images. A four quadrant Super-X EDX detector enables high analytical capability down to atomic scale. A Gatan imaging filter (Quantum ER) for electron energy loss spectrometer (EELS) and energy-filtered imaging attached to Themis Z provides fast spectrum (1000/sec) acquisition and it is capable to collect spectra in both low and high-energy regimes simultaneously.
The field-emission electron gun is equipped with a monochromator; the use of such an electron probe in analytical studies with EELS provide high energy resolution (<0.2 eV) providing the possibility to measure band-gap of materials, surface plasmons, valence band structures, chemical bond information etc. at the atomic scale.
Automated tomography acquisitions in TEM, STEM and STEM-EDX are also possible. A number of sample holders are present for imaging, analytical studies, tomography and in-situ heating/cooling experiments.
Themis Z (TEM/STEM - specifications)
- Schottky-type field emission gun XFEG with Monochromator
- Acc. Voltage: 300 kV (60 kV, 200 kV)
- Probe and Image Cs correctors
- Resolution: 300 kV: ≤ 60 pm, 200kV: ≤ 70 pm, 60 kV: ≤100 pm
- CL apertures C2: 150, 70, 50 and 10 µm
- SA apertures: 800, 200, 40 and 10 µm
Themis Z options
- Gatan Oneview camera with In-situ option (4kx4k, ≥300 fps at 512x512)
- SuperX EDS detector (Resolution ≤136 eV, Detectable Z≥B)
- Gatan Quantum 965 ER (Energy spread: 0.25 eV at 300 kV, CCD for image filter: 2kx2k)
- STEM Detectors: BF, ADF (DPC & iDPC), ABF and HAADF; Gatan BF and ADF
Themis Z Sample holders
- Single tilt (a±35o)
- Low-background double-tilt (a: ±35o / b: ±30o)
- Vacuum transfer double-tilt (a: ±30o / b: ±30o)
- High-tilt tomography (a: ±70o)
- Motorized dual-axis tomography (a: ±70o)
- Double-tilt cooling (-170oC; a: ±30o / b:±30o)
- Double-tilt heating (1000oC;a: ±30o / b:±30o)
- Cryo-transfer (-170oC; a: ±70o)
JEOL JEM 2100 microscopes at EMC
EMC has two 200 kV workhorse instruments. The instruments were acquired in 2007 but have been upgraded with modern imaging detectors allowing advanced imaging and diffraction techniques, which are very important for the development of modern world leading electron crystallography techniques.
JEOL JEM 2100
JEOL JEM-2100F (TEM/STEM) specifications
- Schottky-type field emission gun
- Ultra-high Resolution Polepieces (URP): (f=1.9mm, Cs=0.5mm, Cc=1.1mm)
- Acc. Voltage: 200 kV (or 80 kV)
- Resolution: Point=1.9Å, Lattice=1.0Å, Information limit=1.3Å
- CL apertures: 1, 10, 40, 100, 200µm
- SA apertures: 1, 2, 10, 20, 50, 100µm
- Magnification: 50x-1,500,000x
JEOL JEM-2100F (TEM/STEM) Option
- Bottom-mounted camera (Gatan Ultrascan 1000)
- Side-mounted camera (Gatan Orious 200D)
- EDS (Resolution=138eV, Detectable Z≥B)
- Gatan GIF Tridiem (Resolution=0.7eV, CCD for image filter: 2kx2k)
- Gatan STEM BF / ADF
- JEOL STEM BF/ADF
- JEOL BEI detector
JEOL JEM-2100 (TEM/STEM)
JEOL JEM-2100 (TEM/STEM) specification
- LaB6 filament
- High-tilt Polepieces (HTP): (f=2.7mm, Cs=1.4mm, Cc=1.8mm)
- Acc. Voltages: 80, 100, 120, 200 kV
- Resolution: Point=2.5Å, Lattice=1.4Å
- CL apertures: 10, 50, 70, 150µm
- SA apertures: 10, 20, 50, 100µm
- Magnification: 50x-1,200,000x
JEOL JEM-2100 (TEM/STEM) options
- Upper mount CCD (Gatan Orius SC200D)
- Bottom mount CCD (Gatan Orius SC1000)
- EDS (Resolution=138eV, Detectable Z≥B)
- JEOL STEM ADF detector
- Precession diffraction device (JEOL & NanoMEGAS)
- Beam blanking device (JEOL)
- JEOL BEI detector
JEOL JEM-2100 (TEM/STEM) Sample holders
- Single-tilt (±42o; high-tilt option: ±60o)
- Double-tilt low-background (±42o /±30o)
- Single-tilt vacuum transfer (±30o)
- Ultrahigh-tilt for tomography (±80o)
- Dual-axis tomography holder (±70o)
- Single-tilt cryo-transfer (Gatan CT3500; ±42o)
- Single-tilt cryo-transfer (Gatan 914; ±65o)
- Double-tilt liquid nitrogen cooling (Gatan CHDT3504; ±42o/ ±30o; -170oC )
- Double-tilt heating (Gatan 652DT; ±42o/ ±30o; 1000oC)
Contact
Professor
- Visiting address
- C574
- Svante Arrhenius väg 16 C
Solid state chemistry; synthesis of inorganic compounds, their structural charac
Last updated: August 22, 2022
Source: MMK