New state-of-the-art SEM and sample preparation equipment is being installed at the electron microscopy center (EMC) at SU.
The installation of FESEM JEOL JSM-IT800 with In-lens Schottky Plus field emission electron gun able to operate at accelerating voltages between 0.01-30 kV is underway. The instrument is equipped with a high-resolution secondary electron detector, a 6-segment annular backscattered electron detector and a new in-lens detector system and the images using different signals can be acquired simultaneously.
Sample preparation equipment for room temperature SEM imaging and cryo-SEM imaging are also being installed.
The new SEM and sample preparation equipment are obtained through the VR infrastructure grant.