Our instruments – SEM
The EMC has three scanning electron microscopes: an easy-access tabletop electron microscope HITACHI-TM3000 and two advanced electron microscopes; JEOL JSM-7000F and JEOL JSM-IT800.
HITACHI-TM3000
- Thermionic-type filament
- Acc. Voltage: 5 kV or 15 kV
- Magnification: 15x - 30 000x
- Option: Bruker Quantax 70 EDS. Resolution: 135eV, Detectable from boron.
JEOL JSM 7000F
- Schottky-type FEG
- Acc. Voltage: 0.1 ~ 30 kV
- Maximum current: 200nA
- Resolution = 1.0 nm (15 kV)
JEOL JSM IT-800
- Schottky-type FEG
- Acceleration voltage: 0.01 - 30 kV
- Maximum current: 500 nA (30 kV)
- Resolution:
- 0.6 nm at 15 kV with Beam De-acceleration
- 1.1 nm at 15 kV (SHL)
- 3.0 nm at 15 kV (WD 10 mm, 5 nA)
- 1.3 nm at LV mode (50 Pa)
- Detectors options:
- Retractable segmented BSED,
- Low vacuum BSED
- In lens hybrid detector (BE and SE at BD)
- Retractable segmented Quad STEM detector
- (DF, HAADF, ANNULAR and BF)
- X-ray Spectrometer:
- EDS detector (JEOL, SDD, 100 mm2
- Soft X-ray emission spectrometer (SXES), with
- gratings JS50XL and JS200N (50 -210 eV, res. 0.3 eV)
- Cryogenic: Removable Cryogenic Stage (-120 C) and
- Cryogenic/Vacuum transfer system.
Equipment for sample preparation
- Ultramicrotome (R.T. and cryo- sectioning)
- Cross Section Polisher (Cryogenic and R.T.)
- Cryogenic sample preparation system
- Coating with Carbon (thermal or e-beam)
- Sputtering with metal (Pt or Au)
- Cutting and polishing equipment
Contact
Gunnar Svensson
Professor
- Visiting address
- C574
- Svante Arrhenius väg 16 C
Solid state chemistry; synthesis of inorganic compounds, their structural charac
Last updated: September 13, 2024
Source: MMK